最物超所值的高性能原子力显微镜
适合各种研究者预算要求的同级别最高性能的原子力显微镜
• 任何样品上同级别最高性能表现
• 高重现性的测量
• 结合ScanAsyst自动成像参数优化技术，最易操作的AFM成像
• 由创新的峰值力模式实现
Dimension® Edge™ 原子力显微镜采用****， 其仪器性能、测试功能和操作性在同类产品中处于最高水平。Dimension系列中性价比***闭环扫描原子力显微镜，专利的传感器设计显著地降低噪音和漂移，既获得了闭环的精度，又具有开环的噪音水平，在大样品台AFM上实现 了小样品台AFM的成像性能。
性价比***闭环Dimension系列AFM
• 独有的传感器设计既获得了闭环的测量精度，又具有开环的低噪音水平
• 显著地降低噪音和漂移，在大样品台AFM上实现了小样品台AFM的成像性能
• 显微镜和电路的设计既保证了高成像性能，并且提供一个合适的仪器价格
快速，精确，高分辨的测量结果
• 直观、优化的工作流程，确保短时间内即根据实验情况优化设置
• 5百万像素的高分辨率相机和马达驱动可编程平台可提供快速样品导航和高效的多点测量
• 从大范围扫描到最高分辨检测的无缝过渡可在短时间内获得准确结果
适用于任何实验样品和研究目的的解决方案
• 开放式平台设计可适应各种实验和样品的需求
• 仪器设计和软件开发使用Bruker最全面的AFM技术，满足**使用需求
• 内置的信号路由模块帮助研究者可以按照不同的研究方向制定相应的实验方案
拥有先进的纳米级测量能力，适用范围广泛
• 模块化设计不增加仪器成本的前提下，大大提高仪器性能
• 凝聚了10年AFM专业设置精华的第8代数据采集处理软件，配备特定实验模式选项
• 完整平台控制既可直观导航，又可进行强大的编程控制
| Dimension Edge Specifications | |
| X-Y Scan Range | 90μm x 90μm typical, 85μm minimum |
| Z Range | 10μm typical in imaging and force ramp modes, 9.5μm minimum |
| Vertical Noise Floor | <50pm RMS in appropriate environment, typical imaging bandwidth (up to 625Hz) |
| XY Position Sensor Noise Level (Closed Loop) | <0.5nm RMS typical imaging bandwidth (up to 625Hz) |
| Z Position Sensor Noise Level (Closed Loop) | <0.2nm RMS typical imaging bandwidth (up to 625Hz) |
| Sample/Size/Holder | 150mm vacuum chuck, 15mm thick; Up to 40mm thick with optional frame spacer |
| Motorized Positioning Stage (X-Y axis) | 150mm x 150mm inspectable area; Programmable for multi-site measurements |
| Microscope Optics | 5-megapixel digital camera; 180μm to 1465μm viewing area; Digital zoom and motorized focus |
| Signal Access | Configurable I/O signal access built into controller; Includes customizable signal routing, digital feedback, and dual digital lock-in |
| Single Point Spectroscopy | Three-axis closed loop control for point-and-shoot positioning and ramping; Spring constant calibration with built-in thermal tune |
| Sample Temperature Control | -35 to +250°C with optional heater/cooler accessory; Includes gas purging capability |
| AFM Modes | |
| Standard | Contact Mode, Lateral Force Microscopy, TappingMode™, PhaseImaging™, LiftMode, Magnetic Force Microscopy, Electric Force Microscopy, Dark Lift, Force Spectroscopy, Nanoindentation, Nanolithography, Adhesion, ScanAsyst |
| Optional | Scanning Tunneling Microscopy, Conductive AFM, Tunneling AFM, Scanning Capacitance Microscopy, Surface Potential Microscopy, Piezoresponse Microscopy, Force Modulation Microscopy, Liquid Imaging, Thermal Analysis, Electrochemical AFM |
| Probes | Visit www.brukerAFMprobes.com to see our ocmprehensive listing of probes, including Bruker-exclusive ScanAsyst probes |
| Facility Requirements | |
| Vibration Isolation | Vibration isolation table or integrated vibration/acoustic isolation enclosure required |
| Laser Classification | Class 2M |
| Certification | CE |